Reflecting Microscope System with very high Numerical Aperture

Abstract


In single-molecule microscopy imaging applications, localization precision is a critical issue. Since the localization precision in a certain direction is proportional to the width of the point spread function (PSF) of the image in the same direction, a microscope with a higher numerical aperture (NA) can reduce the width of the PSF and thus improve the localization precision. In this use case, we demonstrate the modeling of very compact reflecting microscope system with an NA of 0.99 (Inagawa et al., 2015), and compare the results obtained with VirtualLab Fusion’s fast physical optics technology to the reference.

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Use Case

Analysis of Off-Axis Imaging by a High-NA Microscope

It is demonstrated that the PSF is distorted due to the aberration caused by off-axis imaging.

Use Case

Analysis of PSF of a Dipole Source by a High-NA Microscopy System

It is demonstrated that the PSFs have different shapes when the orientation of the dipole source changes.

Use Case

Single-Molecule Imaging by High-NA Fourier Microscope

We model a complete high-NA Fourier microscopy system for single-molecule imaging. Exemplarily, we show the effect of e.g. Fresnel losses at interfaces, diffraction from apertures, and compare the simulation results to a reference.