Focusing of Gaussian-Laguerre Beam for STED Microscopy
Abstract
STimulated Emission Depletion (STED) microscopy uses a tiny spot in the focal plane to generate super resolution. Two focused beams are needed. One is the excitation beam. The other one is the depletion beam, which can eliminate the emission light. The depletion beam needs to be donut-shaped. In [P. Török and P.R.T Monro, (2004)], the authors investigated the donut-shaped PSF can be generated by focusing high order Gaussian-Laguerre beam. In VirtualLab Fusion, the focusing of such high-order Gaussian-Laguerre beam is modeled and analyzed straightforwardly.
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