NEWS

Enhancements of 3-D Grating Simulation

(August 27, 2010)

The simulation of 3-D grating structures is being considerably enhanced in the forthcoming version of VirtualLab™. Real 3-D grating structures are used more and more extensively for the design of optical components. The rigorous simulation techniques provided by VirtualLab™ give an insight to the op...

Get in touch at SPIE Optics + Photonics, San Diego, CA, USA!

(July 13, 2010)

We offer several opportunities to learn more about VirtualLab™ at SPIE Optics + Photonics, San Diego, CA, USA, starting August 1, 2010. VirtualLab™ is being presented at the SPIE show at booth 628 of our distributor in the United States, Jenoptik Optical Systems, Inc. Further a free seminar on &quot...

VirtualLab™ 4.8 Released

(July 09, 2010)

VirtualLab™ and VirtualLab™ Advanced 4.8 have been released. VirtualLab™ 4.8 extends the flexibility of 2-D grating simulations. Using so called stacks, the period of the structure can be defined by sequences of optical interfaces, including grating, conical, aspherical, sampled and programmable int...

Electromagnetic analysis of microstructures

The VirtualLab™ Grating Toolbox allows the rigorous electromagnetic analysis of 2D gratings, 3D gratings, and photonic crystals with features from nanometer to millimeter scale. Diffraction efficiency, near field, polarization, reflectance, transmittance, absorption and the field inside gratings can be calculated. Various customization features allow the analysis and optimization of gratings with user defined structures. These include the import of measured height profiles, as well as programmable height profiles and media which allow to enter a formula describing a height profile or a refractive index distribution. In addition grating structures can be constructed by building stacks of predefined surfaces and media.

The powerful parameter run of VirtualLab™ enables the investigation of tolerances and the optimization of gratings.

Your Benefit

Customized 2D grating defined as a stack of predefined surfaces and index modulations.
  • Electromagnetic and approximated analysis of surface and volume gratings as for example diffractive beam splitters, polarizers, anti reflection structures, diffractive optical elements, photovoltaic systems, holographic gratings, and spectroscopic gratings.
  • 2D and 3D gratings with feature sizes from nanometer to millimeter scale.
  • Calculation of diffraction orders, efficiency, near field, polarization, reflectance, transmittance, absorption and field inside grating.
  • Investigation of tolerances and optimization by parameter run.

Selected Features

Analysis of 2D gratings. The Grating Toolbox can perform a rigorous or approximated analysis of 2D gratings. Predefined gratings as for example sinusoidal, triangular, sawtooth, holographic gratings as well as customized grating structures can be modeled. Customization includes for example the import of measured height profiles, as well as programmable height profiles and media which allow to enter a formula describing a height profile or a refractive index distribution. Typical applications are the analysis of polarizers, spectroscopic gratings, diffractive beam splitters, 2D photonic crystals, gratings of fiber and wave guide coupling.

Transmitted field of a 3D pillar type grating with a period of two wavelengths.

Analysis of 3D gratings. 3D gratings are modulated along the x-, y-, and z-direction and are periodic in x and y direction.  These gratings are often used as antireflection sub-wavelength structures replacing coatings. The Grating Toolbox enables the analysis and optimization of 3D pillar type surface gratings.

Evaluation of field distributions. Depending on grating applications various evaluations of simulation results are required. This includes for example the calculation of diffraction orders, efficiencies, near field, polarization, reflectance, transmittance, absorption and field inside grating.

Tolerance analysis and grating optimization by parameter run. The powerful parameter run of VirtualLab™ enables the variation of a single parameter, the multidimensional scanning parameter variation and a random (Monte-Carlo) parameter variation. This allows the analysis of tolerances and the optimization of predefined and customized grating structures.

Reflectance of 3D sub-wavelength pillar type medium.