NEWS

Learn more about VirtualLab™ at "Photonics West 2012”!

(January 11, 2012)

LightTrans is planning several activities at the Photonics West Conferences and Exhibitions taking place in San Francisco, CA, starting on January 21 2012. We would like to welcome you at our booth no. 4601 in the German Pavilion and invite you to a presentation of VirtualLab™ 5 – the new generation...

VirtualLab™ 5.1 Released!

(December 20, 2011)

The latest release VirtualLab™ 5.1 introduces several novelties and improvements. First, a 3D view of the entire system has been introduced making the system setup easier. A ray tracing mode is available now which gives a first insight about the behavior of systems. Catalogs for light sources and co...

Software Courses 2012 – First Announcement

(November 28, 2011)

In order to allow a reliable planning for our customers we have scheduled two software courses for 2012 already. The two courses are

Course 1: April 24 - 27, 2012 "Introduction to Unified Optical Modeling using LightTrans VirtualLab™" Speaker: Dr. Michael Kuhn, LightTrans Target Group: ...

Rigorous analysis of 2D and 3D gratings

Surface profile of a 3D sub-wavelength grating used as antireflection structure.

The VirtualLab™ Grating Toolbox allows the rigorous electromagnetic analysis of 2D gratings, 3D gratings, and photonic crystals with features from nanometer to millimeter scale. Diffraction efficiency, near field, polarization, reflectance, transmittance, absorption and the field inside gratings can be calculated. Various customization features allow the analysis and optimization of gratings with user defined structures. These include the import of measured height profiles, as well as programmable height profiles and media which allow to enter a formula describing a height profile or a refractive index distribution.

In addition grating structures can be constructed by building stacks of surfaces and homogeneous as well as inhomogeneous media. The powerful optimization feature of VirtualLab™ enables the local and global parametric optimization of gratings. The investigation of tolerances is possible by the parameter run.

Your Benefit

Customized 2D grating defined as a stack of surfaces and index modulations.
Customized 2D grating defined as a stack of surfaces and index modulations.
  • Electromagnetic and approximated analysis of surface and volume gratings as for example diffractive beam splitters, polarizers, antireflection structures, diffractive optical elements, photovoltaic systems, holographic gratings, and spectroscopic gratings.
  • 2D and 3D gratings with feature sizes from nanometer to millimeter scale.
  • Calculation of diffraction orders, efficiency, near field, polarization, reflectance, transmittance, absorption and field inside grating.
  • Investigation of tolerances, parameter variations and parametric optimization.

Selected Features

Surface profile of 2D sinusoidal grating.

Analysis of 2D and 3D gratings. The Grating Toolbox is using the Fourier Modal Method for a rigorous analysis of 2D and 3D gratings. Predefined gratings as for example sinusoidal, triangular, sawtooth, holographic gratings as well as customized grating structures can be modeled. Typical applications are the analysis of polarizers, spectroscopic gratings, diffractive beam splitters, photonic crystals, gratings for fiber coupling, sub-wavelength gratings, moth-eye structures, artificial media and zeroth-order gratings.

Pyramid type 3D surface grating
Pyramid type 3D surface grating

Customized 2D and 3D gratings. The Grating Toolbox supports the import of measured 1D and 2D height profiles. Furthermore, programmable interfaces and programmable media allow to enter a formula describing a height profile or the distribution of the refractive index. The stack concept enables the description of gratings as a sequence of surfaces as well as homogeneous and inhomogeneous media.

Evaluation of field distributions. Depending on grating applications, various evaluations of simulation results are required. This includes for example the calculation of diffraction orders, efficiencies, near field, polarization, reflectance, transmittance, absorption and field inside grating.

Tolerance analysis and optimization of gratings. The powerful parameter run of VirtualLab™ enables the variation of a single parameter, the multidimensional scanning parameter variation and a random (Monte-Carlo) parameter variation in order to investigate the effects of tolerances . VirtualLab™ enables the parametric optimization of predefined and customized grating structures.

Reflectance of 3D sub-wavelength pillar type medium.

Reflectance of 3D sub-wavelength pillar type medium.